JIEMS (Journal of Industrial Engineering and Management Systems)

Rietveld analysis is a means of revealing the detailed structure and composition of crystalline sample using x-ray powder diffraction data. This research presents the use of the Rietveld method using Rietica program to obtain the phase abundance of crystoballite crystal from rice husk sintered at 850oC, 950oC and 1100oC that has previously been demonstrated.The model parameters are refined by the method
of least squares until a good fit (2) to the observed data is obtained. The refined parameters in this study are background, scale factor, space groups, atom co-ordinates (U,V,W), preferred orientation, and the lattice parameters. The results showed that quantitative crystoballite crystal were 87.8, 89.8 and 98.4% weight, respectively. An acceptable result for estimation of lattice parameters and weight
percentage of crystoballite with reliability (2) was found to be < 4. The results also show that analysis by Rietveld method is efficient to control the quantity of crystoballite in the sintering process.

Keywords: Rietveld, Rice Husk, X-Ray Diffraction

Sembiring, dan Karo-Karo, (2007),”Pengaruh suhu Sintering Terhadap Karakteristik Termal dan Mikrostruktur Silika Sekam Padi,

Jurnal Sains dan Teknologi, Mipa Unila.

Sembiring, (2007), Karakterisasi Silika Sekam Padi Sebagai Bahan

Keramik Dengan Teknik Sintering, Prosiding, Dies Natalis

Universitas Lampung.

Shinohara, Y and Kohyama, N (2004), “Quantitative Analysis of

Tridymite and Crystobalite Crystalized in Rice Husk Ash by

Heating”, National Institute of Health.

Nurhayati (2006), “Karakteristik Silika Sekam Padi Akibat Perlakuan

Sintering Terhadap Pemanfaatannya Sebagai Bahan Keramik,

Skripsi, Universitas Lampung.

Ebtadianti, L.L, (2007), “Karakterisasi Tingkat Kristalinitas Silika

sekam Padi”, Skripsi, Universitas Lampung.

Reni (2007), “Pengaruh Perlakuan Sintering Terhadap Sifat Termal

dan Mikrostruktur Silika Sekam Padi”, Skripsi, Universitas

Lampung.

Sembiring (2008), “Karakteristik keramik cordierite berbasis silika

sekam padi pada temperatur rendah (Low Temperature),

Prosiding seminar Nasional Sains dan Teknologi II,

Universitas Lampung.

Sembiring dan Pulung Karo-Karo, (2009), “Pembuatan dan

Karakterisasi Gelas Cordierite dari silika Hasil Ekstraksi

Sekam Padi, Journal of Industrial Engineering & Management

Systems/JIEMS, Universitas Bunda Mulia, Jakarta.

Sembiring, Posman Manurung, dan Pulung Karo-Karo,

(2009),”Pengaruh Suhu Tinggi Terhadap Karakteristik Keramik

Cordierite Berbasis Silika Sekam Padi, Jurnal Fisika dan

aplikasinya, FMIPA ITS, 5, 090107.

Ikram, N and Akhter, M (1988), “X-Ray Diffraction Analysis of

Silicon Prepared from Rice Husk Ash”, Journal of Materials

Science, 23, 2379 – 2381.

Romero, J.N; Reinoso, F.R (1996), “Synthesis SiC from Rice Husk Catalyzed by Iron, Cobalt or Nikel”, Journal Materials Science, 31, 779 – 784.

Rahman, I.A (1994), “Preparation of Si3N4 by Corbothermal Reduction of Digested Rice Husk”, Ceramic International, 20, 195 – 199.

Bose, S; Acharya, H.N; Banerjee, H.D (1993), “Electrical, Thermal Thermoelectric and Related of Magnesium Silicate Semiconductor Prepared from Rice Husk”, Journal of Material Science, 28, 5461 – 5468.

Chatterjee, M and Naskar M.K (2006), “Sol-Gel Synthesis of Lithium Aluminium Silicate Powders; The Effect of Silica Sources”, Ceramic International, 32, 623 – 632.

Hunter, B.A and C.J Howard.1997. LHPM Manual, A Computer Program for Rietveld Analysis of X-ray and Neutron Powder Diffraction Patterns. Lucas Heights Research Laboratories. Australian Nuclear Science and Technology Organization. Australia. P1-27.

Kisi, E. H. 1994. Rietveld Analysis Of Powder Diffraction Patterns. Material Forum.18.p135-153.

Hunter, B.A. 1997. Rietica for 95/98/NT Version 1.62. Australia.

Young, R.A. 1995. The Rietveld Method, International Union Of Crystalography Oxford University Press

Smith, W. 1996. Principles of Material and Sciences Enginering. Third Edition. Mc Graw-hill. Inc. USA. P581.

PCPDFWIN Version 1.30. 1997. JCPDS-International Centre for Diffraction Data.

Pluth, JJ, Smith J.V and Faber, J, 1997,”Crystal Structure of Low Crystoballite, p369-377

Rietveld, H.M, 1969,”A Profile Refinement Method for Nuclear and Magnetic Structure, J. Applied Cryst, 2, 65-71

Kisi, E.H, 1994,”Rietveld Analysis of Powder Diffraction Pattern, Material Forum, 18, p135-153.